Setting quality control requirements to balance cycle time and yield - The single machine case

Miri Gilenson, Liron Yedidsion, Michael Hassoun

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Control limits in use at metrology stations are traditionally set by yield requirements. Since excursions from these limits usually trigger machine stoppage, the monitor design has a direct impact on the station's availability, and thus on the product cycle time (CT). In this work we lay the foundation for a bi-criteria trade-off formulation between expected CT and die yield based on the impact of the inspection control limits on both performance measures. We assume a single machine plagued by a particle deposition process and immediately followed by a monitor step. We explore the impact of the upper control limit on the expected final yield on one hand, and on the distribution of the station time between consecutive stoppages on the other. The obtained model enables decision makers to knowingly sacrifice yield to shorten CT and vice versa.

Original languageEnglish
Title of host publicationProceedings of the 2012 Winter Simulation Conference, WSC 2012
DOIs
StatePublished - 1 Dec 2012
Externally publishedYes
Event2012 Winter Simulation Conference, WSC 2012 - Berlin, Germany
Duration: 9 Dec 201212 Dec 2012

Publication series

NameProceedings - Winter Simulation Conference
ISSN (Print)0891-7736

Conference

Conference2012 Winter Simulation Conference, WSC 2012
Country/TerritoryGermany
CityBerlin
Period9/12/1212/12/12

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