SHI induced surface modifications of immiscible Fe/Bi bilayer system

Abhishek Gupta; D. C. Agarwal; S. A. Khan; A. Tripathi; D. Kabiraj; S. Mohapatra; T. Som; D. K. Avasthi; R. S. Chauhan

doi:10.1016/j.surfcoat.2009.02.106

SHI induced surface modifications of immiscible Fe/Bi bilayer system

Abhishek Gupta, D. C. Agarwal, S. A. Khan, A. Tripathi, D. Kabiraj, S. Mohapatra, T. Som, D. K. Avasthi, R. S. Chauhan

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Topographical evolution of immiscible Fe/Bi bilayer systems irradiated with 120 MeV Au ions was studied using atomic force microscopy (AFM). Bilayer films of Fe-Bi were prepared by thermal evaporation on Si <100> substrate. The grain size of the films was estimated by glancing angle X-ray diffraction. The surface roughness of the as-deposited films has been found to be 23.6 nm from AFM analysis. The roughness of the sample is found to be decreased at lower fluences due to the strain relaxation between Fe and Bi by energy deposition. However, at higher fluences, beyond the 6 × 10¹² ions cm^{- 2}, the agglomeration of smaller grains has been observed due to the shear flow induced by the formation of dangling bonds by SHI irradiation, which results in the surface roughening. The observed behavior of surface smoothening and roughening under SHI irradiation may be explained on the basis of thermal spike model.

Original language	English
Pages (from-to)	2399-2402
Number of pages	4
Journal	Surface and Coatings Technology
Volume	203
Issue number	17-18
DOIs	https://doi.org/10.1016/j.surfcoat.2009.02.106
State	Published - 15 Jun 2009
Externally published	Yes

Keywords

Atomic force microscopy
GAXRD
Ion irradiation effects
Surface roughness

ASJC Scopus subject areas

General Chemistry
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/j.surfcoat.2009.02.106

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title = "SHI induced surface modifications of immiscible Fe/Bi bilayer system",

abstract = "Topographical evolution of immiscible Fe/Bi bilayer systems irradiated with 120 MeV Au ions was studied using atomic force microscopy (AFM). Bilayer films of Fe-Bi were prepared by thermal evaporation on Si <100> substrate. The grain size of the films was estimated by glancing angle X-ray diffraction. The surface roughness of the as-deposited films has been found to be 23.6 nm from AFM analysis. The roughness of the sample is found to be decreased at lower fluences due to the strain relaxation between Fe and Bi by energy deposition. However, at higher fluences, beyond the 6 × 1012 ions cm- 2, the agglomeration of smaller grains has been observed due to the shear flow induced by the formation of dangling bonds by SHI irradiation, which results in the surface roughening. The observed behavior of surface smoothening and roughening under SHI irradiation may be explained on the basis of thermal spike model.",

keywords = "Atomic force microscopy, GAXRD, Ion irradiation effects, Surface roughness",

author = "Abhishek Gupta and Agarwal, {D. C.} and Khan, {S. A.} and A. Tripathi and D. Kabiraj and S. Mohapatra and T. Som and Avasthi, {D. K.} and Chauhan, {R. S.}",

year = "2009",

month = jun,

day = "15",

doi = "10.1016/j.surfcoat.2009.02.106",

language = "English",

volume = "203",

pages = "2399--2402",

journal = "Surface and Coatings Technology",

issn = "0257-8972",

publisher = "Elsevier B.V.",

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TY - JOUR

T1 - SHI induced surface modifications of immiscible Fe/Bi bilayer system

AU - Gupta, Abhishek

AU - Agarwal, D. C.

AU - Khan, S. A.

AU - Tripathi, A.

AU - Kabiraj, D.

AU - Mohapatra, S.

AU - Som, T.

AU - Avasthi, D. K.

AU - Chauhan, R. S.

PY - 2009/6/15

Y1 - 2009/6/15

N2 - Topographical evolution of immiscible Fe/Bi bilayer systems irradiated with 120 MeV Au ions was studied using atomic force microscopy (AFM). Bilayer films of Fe-Bi were prepared by thermal evaporation on Si <100> substrate. The grain size of the films was estimated by glancing angle X-ray diffraction. The surface roughness of the as-deposited films has been found to be 23.6 nm from AFM analysis. The roughness of the sample is found to be decreased at lower fluences due to the strain relaxation between Fe and Bi by energy deposition. However, at higher fluences, beyond the 6 × 1012 ions cm- 2, the agglomeration of smaller grains has been observed due to the shear flow induced by the formation of dangling bonds by SHI irradiation, which results in the surface roughening. The observed behavior of surface smoothening and roughening under SHI irradiation may be explained on the basis of thermal spike model.

AB - Topographical evolution of immiscible Fe/Bi bilayer systems irradiated with 120 MeV Au ions was studied using atomic force microscopy (AFM). Bilayer films of Fe-Bi were prepared by thermal evaporation on Si <100> substrate. The grain size of the films was estimated by glancing angle X-ray diffraction. The surface roughness of the as-deposited films has been found to be 23.6 nm from AFM analysis. The roughness of the sample is found to be decreased at lower fluences due to the strain relaxation between Fe and Bi by energy deposition. However, at higher fluences, beyond the 6 × 1012 ions cm- 2, the agglomeration of smaller grains has been observed due to the shear flow induced by the formation of dangling bonds by SHI irradiation, which results in the surface roughening. The observed behavior of surface smoothening and roughening under SHI irradiation may be explained on the basis of thermal spike model.

KW - Atomic force microscopy

KW - GAXRD

KW - Ion irradiation effects

KW - Surface roughness

UR - http://www.scopus.com/inward/record.url?scp=67349239666&partnerID=8YFLogxK

U2 - 10.1016/j.surfcoat.2009.02.106

DO - 10.1016/j.surfcoat.2009.02.106

M3 - Article

AN - SCOPUS:67349239666

SN - 0257-8972

VL - 203

SP - 2399

EP - 2402

JO - Surface and Coatings Technology

JF - Surface and Coatings Technology

IS - 17-18

ER -

SHI induced surface modifications of immiscible Fe/Bi bilayer system

Abstract

Keywords

ASJC Scopus subject areas

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