Significance of bias light spectral composition for accurate measurement of silicon solar cell spectral response

Lev Kreinin, Ninel Bordin, Ygal Eisenberg, Naftali Eisenberg

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

To determine solar cell spectral response (SR) at working illumination conditions, measurements of the signal generated by a modulated spectral beam imposed on a DC short circuit current due to white light bias with different irradiances are typically used. In practice the bias light source does not usually simulate the sun's spectrum. However the effect of the spectral composition of the bias light on the SR measurements is not known. The goal of this work is to find empirical evidence of the effect of the bias light spectrum on measured Si solar cell SR. The bifacial solar cell samples used for this study can be characterized by: significant dependence of SR on injection level, and different spatial distribution of bulk recombination centers. The sources of bias light were chosen based on their spectral composition which controls the depth distribution of carriers generation during SR measurements. An incandescent halogen lamp with a variable power supply voltage with/without optical neutral filters and ∼ 617 nm light emitting diodes were used. As the measurements show, the spectrum of the white bias light emitted by a tungsten filament of color temperature in the range 2400 - 3900 K is not a critical factor in SR measurements. However, use of highly absorbed bias light can result in a different SR compared to that measured with white light bias.

Original languageEnglish
Title of host publication33rd IEEE Photovoltaic Specialists Conference, PVSC 2008
DOIs
StatePublished - 1 Dec 2008
Externally publishedYes
Event33rd IEEE Photovoltaic Specialists Conference, PVSC 2008 - San Diego, CA, United States
Duration: 11 May 200816 May 2008

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Conference

Conference33rd IEEE Photovoltaic Specialists Conference, PVSC 2008
Country/TerritoryUnited States
CitySan Diego, CA
Period11/05/0816/05/08

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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