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Single-Event Upset Tolerance Study of a Low-Voltage 13T Radiation-Hardened SRAM Bitcell
Avner Haran, Eitan Keren, David David, Nati Refaeli, Robert Giterman, Matan Assaf, Lior Atias, Adam Teman, Alexander Fish
Research output: Contribution to journal › Article › peer-review
7
Scopus
citations