Abstract
A variational formulation and an efficient numerical method are derived for thin film critical-state problems. We use this method to solve problems for various film shapes with either the Bean or Kim current-voltage relation characterizing the superconducting material.
Original language | English |
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Pages (from-to) | 180-193 |
Number of pages | 14 |
Journal | Journal of Computational Physics |
Volume | 144 |
Issue number | 1 |
DOIs | |
State | Published - 20 Jul 1998 |
Externally published | Yes |
Keywords
- Critical current
- Numerical solution
- Superconductivity
- Thin film
- Variational inequality
ASJC Scopus subject areas
- Numerical Analysis
- Modeling and Simulation
- Physics and Astronomy (miscellaneous)
- General Physics and Astronomy
- Computer Science Applications
- Computational Mathematics
- Applied Mathematics