Abstract
A method for polarimetric measurement that uses a discrete space-variant subwavelength dielectric grating is presented. One retrieves the polarization state by measuring the far-field intensity of a beam emerging from the grating followed by a polarizer. The analysis for a partially polarized, quasi-monochromatic beam is performed by use of the beam coherence polarization matrix along with an extended van Cittert-Zernike theorem. We experimentally demonstrate polarization measurements of both fully and partially polarized light.
Original language | English |
---|---|
Pages (from-to) | 2245-2247 |
Number of pages | 3 |
Journal | Optics Letters |
Volume | 30 |
Issue number | 17 |
DOIs | |
State | Published - 1 Sep 2005 |
Externally published | Yes |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics