Spatially resolved mapping of phase transitions in liquid-crystalline materials by X-ray birefringence imaging

Yating Zhou, Rhian Patterson, Benjamin A. Palmer, Gregory R. Edwards-Gau, Benson M. Kariuki, N. S.Saleesh Kumar, Duncan W. Bruce, Igor P. Dolbnya, Stephen P. Collins, Andrew Malandain, Kenneth D.M. Harris

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The X-ray Birefringence Imaging (XBI) technique, first reported in 2014, is a sensitive method for spatially resolved mapping of the local orientational properties of anisotropic materials. We report the first application of the XBI technique to characterize molecular orientational ordering in a liquid crystalline material, demonstrating significant potential for exploiting XBI measurements to advance structural understanding of liquid crystal phases.

Original languageEnglish
Pages (from-to)3005-3011
Number of pages7
JournalChemical Science
Volume10
Issue number10
DOIs
StatePublished - 1 Jan 2019
Externally publishedYes

ASJC Scopus subject areas

  • Chemistry (all)

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