Spectral mismatch correction for GaAs solar cells with varying junction depths

K. A. Emery; C. R. Osterwald; H. Aharoni

doi:10.1016/0038-1101(87)90152-3

Spectral mismatch correction for GaAs solar cells with varying junction depths

K. A. Emery, C. R. Osterwald, H. Aharoni

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

This study experimentally demonstrates that large errors 25%) in solar cell current measurements can occur even if a properly calibrated reference cell of the same material system is used to set the intensity of the light source. The spectral mismatch correction procedure allows the accurate (2%) measurement of the illuminated I-V characteristics. This is done with respect to standard test conditions defined by the temperature, intensity and reference spectrum. The results are independent of the light source spectral irradiance, or reference cell spectral response.

Original language	English
Pages (from-to)	213-215
Number of pages	3
Journal	Solid State Electronics
Volume	30
Issue number	2
DOIs	https://doi.org/10.1016/0038-1101(87)90152-3
State	Published - 1 Jan 1987
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

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10.1016/0038-1101(87)90152-3

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title = "Spectral mismatch correction for GaAs solar cells with varying junction depths",

abstract = "This study experimentally demonstrates that large errors 25%) in solar cell current measurements can occur even if a properly calibrated reference cell of the same material system is used to set the intensity of the light source. The spectral mismatch correction procedure allows the accurate (2%) measurement of the illuminated I-V characteristics. This is done with respect to standard test conditions defined by the temperature, intensity and reference spectrum. The results are independent of the light source spectral irradiance, or reference cell spectral response.",

author = "Emery, {K. A.} and Osterwald, {C. R.} and H. Aharoni",

note = "Funding Information: Acknowledgemenr-This work was supported by the U.S. Department of Energy under contract number DE-ALOZ-83CHl0093.",

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AU - Emery, K. A.

AU - Osterwald, C. R.

AU - Aharoni, H.

N1 - Funding Information: Acknowledgemenr-This work was supported by the U.S. Department of Energy under contract number DE-ALOZ-83CHl0093.

PY - 1987/1/1

Y1 - 1987/1/1

N2 - This study experimentally demonstrates that large errors 25%) in solar cell current measurements can occur even if a properly calibrated reference cell of the same material system is used to set the intensity of the light source. The spectral mismatch correction procedure allows the accurate (2%) measurement of the illuminated I-V characteristics. This is done with respect to standard test conditions defined by the temperature, intensity and reference spectrum. The results are independent of the light source spectral irradiance, or reference cell spectral response.

AB - This study experimentally demonstrates that large errors 25%) in solar cell current measurements can occur even if a properly calibrated reference cell of the same material system is used to set the intensity of the light source. The spectral mismatch correction procedure allows the accurate (2%) measurement of the illuminated I-V characteristics. This is done with respect to standard test conditions defined by the temperature, intensity and reference spectrum. The results are independent of the light source spectral irradiance, or reference cell spectral response.

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U2 - 10.1016/0038-1101(87)90152-3

DO - 10.1016/0038-1101(87)90152-3

M3 - Article

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SP - 213

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JO - Solid State Electronics

JF - Solid State Electronics

IS - 2

ER -

Spectral mismatch correction for GaAs solar cells with varying junction depths

Abstract

ASJC Scopus subject areas

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