Spectral wavefront optical reconstruction by diffraction

E. Frumker, G. G. Paulus, H. Niikura, D. M. Villeneuve, P. B. Corkum

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We demonstrate a new concept of spectrally-resolved wavefront characterization, particular useful for high-harmonic and soft X-ray radiation. It is based on an analysis of radiation diffracted from a slit scanned in front of flat-field spectrometer.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2010
StatePublished - 1 Dec 2010
Externally publishedYes
EventConference on Lasers and Electro-Optics, CLEO 2010 - San Jose, CA, United States
Duration: 16 May 201021 May 2010

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceConference on Lasers and Electro-Optics, CLEO 2010
Country/TerritoryUnited States
CitySan Jose, CA
Period16/05/1021/05/10

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