Spontaneous crystallographic instabilities of Pb nanoparticles in a SiO matrix

Avraham Be'er, Richard Kofman, Fritz Phillipp, Yossi Lereah

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Abstract

The phenomenon of spontaneous instabilities of Pb nanoparticles was studied quantitatively by time-resolved transmission electron microscopy. The phenomenon rates were studied by high-resolution electron microscopy and by dark field microscopy. The origin of the phenomenon as a radiation effect of the high voltage electron beam was excluded by finding the same rates at 200 and 1250 kV electron beams, below and above the threshold for the knock-on process, respectively. The dependence of phenomenon rate on the particles' size was found to be inversely proportional to the particle volume. The temperature was found to influence both the probability for a particle to be in the unstable state and the rate of instabilities. The results are compared with our recent results obtained for spontaneous instabilities of Bi nanoparticles.

Original languageEnglish
Article number075410
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume76
Issue number7
DOIs
StatePublished - 8 Aug 2007
Externally publishedYes

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