Abstract
We report a detailed study of the silver MELLF by optical and electron microscopy (SEM and TEM), densitometry, and moire deflectometry for various surfactants and organic phases. A dispersed structure was found with basic particles of diameter as small as 2-3 nm. Moire deflectometry gave the physical thickness of the films to be about 4 μm. Densitometry measurements indicated the amount of silver in the film is equal to that of an evaporated continuous silver film of thickness 20-60 nm. The films are found to be inhomogeneous in the horizontal plane. A comparison to black, granular interfacial films was also carried out. The evident visual differences between the various films were not strongly reflected in the microscopical results.
| Original language | English |
|---|---|
| Pages (from-to) | 4174-4179 |
| Number of pages | 6 |
| Journal | Journal of Physical Chemistry |
| Volume | 93 |
| Issue number | 10 |
| DOIs | |
| State | Published - 1 Jan 1989 |
ASJC Scopus subject areas
- General Engineering
- Physical and Theoretical Chemistry
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