Abstract
By varying the deposition conditions of C60 thin films and using X-ray diffraction techniques to study the results, we obtain a continuum of structure types ranging from crystalline to amorphous. By measuring the absorption spectra of these films we find that as the film crystallinity increases the fundamental absorption edge and nearby spectral features shift progressively to longer wavelengths. Using a Tauc-type approximation, we find that the optical bandgap Eg = 1.3-1.6 eV for crystalline films and Eg=2.4-2.6 eV for amorphous films. Intermediate values of Eg are obtained depending upon the degree of crystallinity of the film.
Original language | English |
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Pages (from-to) | 283-286 |
Number of pages | 4 |
Journal | Thin Solid Films |
Volume | 295 |
Issue number | 1-2 |
DOIs | |
State | Published - 28 Feb 1997 |
Keywords
- Band structure
- Carbon
- Optical spectroscopy
- Structural properties
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry