Abstract
Knowledge of the morphology of ion damage trails, 'latent ion tracks', typically a few nanometres wide and 10-125 μm long, created along wakes of swift heavy ions in dielectric solids, is a prerequisite for advancement of track applications in nanotechnology. Modeling the tracks as depleted columnar structures with soft to hard boundaries and cylindrical symmetry, the derivation of theoretical track small-angle X-ray scattering cross sections is reported. These quantities enable the determination of track structure parameters, specifically the track electron density function and its radial dispersion, from empirical scattering intensities. The derived expressions can be readily adopted for analysis of small-angle neutron scattering data.
Original language | English |
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Article number | ce5004 |
Pages (from-to) | 71-76 |
Number of pages | 6 |
Journal | Journal of Applied Crystallography |
Volume | 40 |
Issue number | 1 |
DOIs | |
State | Published - 12 Jan 2007 |
Externally published | Yes |
Keywords
- Heavy-ion tracks
- Latent tracks
- Nanotechnology
- Small-angle scattering cross sections
- Track porosity
- Track structure model
ASJC Scopus subject areas
- General Biochemistry, Genetics and Molecular Biology