Study of μm-scale spatial variations in strain of a compositionally step-graded InxGa1-xAs/GaAs(001) heterostructure

K. Rammohan, D. H. Rich, R. S. Goldman, J. Chen, H. H. Wieder, K. L. Kavanagh

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Abstract

The relaxation of strain in compositionally step-graded InxGa1-xAs layers grown on GaAs(001) has been examined with cathodoluminescence (CL) wavelength and linearly polarized imaging approaches. A polarization anisotropy in CL is found, and this correlates with spectral shifts in the peak positions of excitonic luminescence. Varying asymmetries in misfit dislocation densities from transmission electron microscopy are found to be consistent with the μm-scale spatial variations in strain that is deduced from the CL.

Original languageEnglish
Pages (from-to)869
Number of pages1
JournalApplied Physics Letters
DOIs
StatePublished - 1 Dec 1995
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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