Study of the thickness of liquid layers by moiré deflectometry

D. Yogev; O. Kafri; S. Efrima

doi:10.1364/OL.13.000934

Study of the thickness of liquid layers by moiré deflectometry

D. Yogev, O. Kafri, S. Efrima

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

We suggest and demonstrate a novel method for studying the thickness of thin liquid layers. The method is based on ray-deflection analysis of a beam reflected from the edge of the layer and on studying the topography of the layer.

Original language	English
Pages (from-to)	934-936
Number of pages	3
Journal	Optics Letters
Volume	13
Issue number	10
DOIs	https://doi.org/10.1364/OL.13.000934
State	Published - 1 Jan 1988
Externally published	Yes

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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abstract = "We suggest and demonstrate a novel method for studying the thickness of thin liquid layers. The method is based on ray-deflection analysis of a beam reflected from the edge of the layer and on studying the topography of the layer.",

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year = "1988",

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AU - Yogev, D.

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AU - Efrima, S.

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Y1 - 1988/1/1

N2 - We suggest and demonstrate a novel method for studying the thickness of thin liquid layers. The method is based on ray-deflection analysis of a beam reflected from the edge of the layer and on studying the topography of the layer.

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Study of the thickness of liquid layers by moiré deflectometry

Abstract

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