Study of the thickness of liquid layers by moiré deflectometry

D. Yogev, O. Kafri, S. Efrima

Research output: Contribution to journalArticlepeer-review

12 Scopus citations


We suggest and demonstrate a novel method for studying the thickness of thin liquid layers. The method is based on ray-deflection analysis of a beam reflected from the edge of the layer and on studying the topography of the layer.

Original languageEnglish
Pages (from-to)934-936
Number of pages3
JournalOptics Letters
Issue number10
StatePublished - 1 Jan 1988
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics


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