Study of the thickness of liquid layers by moiré deflectometry

D. Yogev; O. Kafri; S. Efrima

doi:10.1364/OL.13.000934

Study of the thickness of liquid layers by moiré deflectometry

D. Yogev
, O. Kafri
, S. Efrima

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

We suggest and demonstrate a novel method for studying the thickness of thin liquid layers. The method is based on ray-deflection analysis of a beam reflected from the edge of the layer and on studying the topography of the layer.

Original language	English
Pages (from-to)	934-936
Number of pages	3
Journal	Optics Letters
Volume	13
Issue number	10
DOIs	https://doi.org/10.1364/OL.13.000934
State	Published - 1 Jan 1988
Externally published	Yes

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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title = "Study of the thickness of liquid layers by moir{\'e} deflectometry",

abstract = "We suggest and demonstrate a novel method for studying the thickness of thin liquid layers. The method is based on ray-deflection analysis of a beam reflected from the edge of the layer and on studying the topography of the layer.",

author = "D. Yogev and O. Kafri and S. Efrima",

year = "1988",

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AU - Kafri, O.

AU - Efrima, S.

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Y1 - 1988/1/1

N2 - We suggest and demonstrate a novel method for studying the thickness of thin liquid layers. The method is based on ray-deflection analysis of a beam reflected from the edge of the layer and on studying the topography of the layer.

AB - We suggest and demonstrate a novel method for studying the thickness of thin liquid layers. The method is based on ray-deflection analysis of a beam reflected from the edge of the layer and on studying the topography of the layer.

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U2 - 10.1364/OL.13.000934

DO - 10.1364/OL.13.000934

M3 - Article

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SN - 0146-9592

VL - 13

SP - 934

EP - 936

JO - Optics Letters

JF - Optics Letters

IS - 10

ER -

Study of the thickness of liquid layers by moiré deflectometry

Abstract

ASJC Scopus subject areas

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