TY - GEN
T1 - Surface-enhanced Raman spectroscopy from colloids at high pressures
AU - Bradley, Michael
AU - Krech, John
AU - Efrima, Shlomo
PY - 1993/1/1
Y1 - 1993/1/1
N2 - High pressure surface enhanced Raman (SERS) spectra are reported for a highly dense silver colloidal suspension, termed a MEtal Liquid-Like Film or MELLF. Comparison is made with the SERS spectrum of a dilute organosol. Raman signals due to adsorbed molecules and the solvent dichloromethane reveal appreciable frequency shifts as the colloidal environment is influenced by temperature, pressure, and packing. The C-Cl stretch of neat dichloromethane near 705 cm-1 shifts 1.7 cm-1 blue in a MELLF. Raman signals due to the adsorbed anisic acid in MELLFs blue shift about 2 cm-1 as 4 kilobars of pressure are applied; the solvent peaks shift blue only about 1 cm-1. Temperature influences the MELLF in two ways: desorption of anisic acid and formation of agglomerated particles.
AB - High pressure surface enhanced Raman (SERS) spectra are reported for a highly dense silver colloidal suspension, termed a MEtal Liquid-Like Film or MELLF. Comparison is made with the SERS spectrum of a dilute organosol. Raman signals due to adsorbed molecules and the solvent dichloromethane reveal appreciable frequency shifts as the colloidal environment is influenced by temperature, pressure, and packing. The C-Cl stretch of neat dichloromethane near 705 cm-1 shifts 1.7 cm-1 blue in a MELLF. Raman signals due to the adsorbed anisic acid in MELLFs blue shift about 2 cm-1 as 4 kilobars of pressure are applied; the solvent peaks shift blue only about 1 cm-1. Temperature influences the MELLF in two ways: desorption of anisic acid and formation of agglomerated particles.
UR - https://www.scopus.com/pages/publications/0027260040
M3 - Conference contribution
AN - SCOPUS:0027260040
SN - 1558991840
T3 - Materials Research Society Symposium Proceedings
SP - 227
EP - 230
BT - Materials Research Society Symposium Proceedings
PB - Publ by Materials Research Society
T2 - Symposium on Atomic-scale Imaging of Surfaces and Interfaces
Y2 - 30 November 1992 through 2 December 1992
ER -