Abstract
Efforts invested at El-Op during the last four years have led to the development of TADIR - engineering model thermal imager, demonstrated in 1998, and eventually to the final production version of TADIR to be demonstrated in full operation during 1999. Both versions take advantage of the high resolution and high sensitivity obtained by the 480×4 TDI MCT detector as well as many more features implemented in the system to obtain a state of the art high-end thermal imager. The production version of TADIR uses a 480×6 TDI HgCdTe detector made by the SCD Israeli company. In this paper we will present the main features of the production version of TADIR.
| Original language | English |
|---|---|
| Pages (from-to) | 427-434 |
| Number of pages | 8 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3698 |
| State | Published - 1 Jan 1999 |
| Externally published | Yes |
| Event | Proceedings of the 1999 Infrared Technology and Applications XXV - Orlando, FL, USA Duration: 5 Apr 1999 → 9 Apr 1999 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering