The mechanism for continuum polarization in laser induced breakdown spectroscopy of Si(111)

John S. Penczak; Yaoming Liu; Richard D. Schaller; Daniel H. Rich; Robert J. Gordon

doi:10.1016/j.sab.2012.06.023

The mechanism for continuum polarization in laser induced breakdown spectroscopy of Si(111)

John S. Penczak, Yaoming Liu, Richard D. Schaller, Daniel H. Rich, Robert J. Gordon

Department of Physics

Research output: Contribution to journal › Article › peer-review

20 Scopus citations

Abstract

Polarization of the plasma luminescence produced by both nanosecond and femtosecond laser ablation of Si(111) was analyzed under different conditions of fluence and detection geometry. It is shown that the luminescence is partially polarized and is directed in the plane of the crystal. The time evolution of the plasma emission signal was also investigated with the use of a streak camera. The mechanism for polarization is proposed to be preferential reflection of s-polarized light (i.e., light polarized normal to the plane of laser incidence) by the melted surface, in agreement with the Fresnel equations. Earlier reports of much stronger polarization are shown to be erroneous.

Original language	English
Pages (from-to)	3-10
Number of pages	8
Journal	Spectrochimica Acta - Part B Atomic Spectroscopy
Volume	74-75
DOIs	https://doi.org/10.1016/j.sab.2012.06.023
State	Published - 1 Aug 2012

Keywords

PRLIBS
Polarization-resolved laser-induced breakdown spectroscopy
Silicon ablation

ASJC Scopus subject areas

Analytical Chemistry
Atomic and Molecular Physics, and Optics
Instrumentation
Spectroscopy

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10.1016/j.sab.2012.06.023

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title = "The mechanism for continuum polarization in laser induced breakdown spectroscopy of Si(111)",

abstract = "Polarization of the plasma luminescence produced by both nanosecond and femtosecond laser ablation of Si(111) was analyzed under different conditions of fluence and detection geometry. It is shown that the luminescence is partially polarized and is directed in the plane of the crystal. The time evolution of the plasma emission signal was also investigated with the use of a streak camera. The mechanism for polarization is proposed to be preferential reflection of s-polarized light (i.e., light polarized normal to the plane of laser incidence) by the melted surface, in agreement with the Fresnel equations. Earlier reports of much stronger polarization are shown to be erroneous.",

keywords = "PRLIBS, Polarization-resolved laser-induced breakdown spectroscopy, Silicon ablation",

author = "Penczak, {John S.} and Yaoming Liu and Schaller, {Richard D.} and Rich, {Daniel H.} and Gordon, {Robert J.}",

note = "Funding Information: This project was supported under Contract Number FA7014-07-C-0047 , with the U.S. Air Force Surgeon General's Office (AF/SG) and administered by the Air Force District of Washington (AFDW). Use of the Center for Nanoscale Materials was supported by the U. S. Department of Energy, Office of Science, Office of Basic Energy Sciences , under Contract No. DE-AC02-06CH11357 . ",

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doi = "10.1016/j.sab.2012.06.023",

language = "English",

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journal = "Spectrochimica Acta - Part B Atomic Spectroscopy",

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AU - Penczak, John S.

AU - Liu, Yaoming

AU - Schaller, Richard D.

AU - Rich, Daniel H.

AU - Gordon, Robert J.

N1 - Funding Information: This project was supported under Contract Number FA7014-07-C-0047 , with the U.S. Air Force Surgeon General's Office (AF/SG) and administered by the Air Force District of Washington (AFDW). Use of the Center for Nanoscale Materials was supported by the U. S. Department of Energy, Office of Science, Office of Basic Energy Sciences , under Contract No. DE-AC02-06CH11357 .

PY - 2012/8/1

Y1 - 2012/8/1

N2 - Polarization of the plasma luminescence produced by both nanosecond and femtosecond laser ablation of Si(111) was analyzed under different conditions of fluence and detection geometry. It is shown that the luminescence is partially polarized and is directed in the plane of the crystal. The time evolution of the plasma emission signal was also investigated with the use of a streak camera. The mechanism for polarization is proposed to be preferential reflection of s-polarized light (i.e., light polarized normal to the plane of laser incidence) by the melted surface, in agreement with the Fresnel equations. Earlier reports of much stronger polarization are shown to be erroneous.

AB - Polarization of the plasma luminescence produced by both nanosecond and femtosecond laser ablation of Si(111) was analyzed under different conditions of fluence and detection geometry. It is shown that the luminescence is partially polarized and is directed in the plane of the crystal. The time evolution of the plasma emission signal was also investigated with the use of a streak camera. The mechanism for polarization is proposed to be preferential reflection of s-polarized light (i.e., light polarized normal to the plane of laser incidence) by the melted surface, in agreement with the Fresnel equations. Earlier reports of much stronger polarization are shown to be erroneous.

KW - PRLIBS

KW - Polarization-resolved laser-induced breakdown spectroscopy

KW - Silicon ablation

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U2 - 10.1016/j.sab.2012.06.023

DO - 10.1016/j.sab.2012.06.023

M3 - Article

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SN - 0584-8547

VL - 74-75

SP - 3

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JO - Spectrochimica Acta - Part B Atomic Spectroscopy

JF - Spectrochimica Acta - Part B Atomic Spectroscopy

ER -

The mechanism for continuum polarization in laser induced breakdown spectroscopy of Si(111)

Abstract

Keywords

ASJC Scopus subject areas

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