The reaction of sputtered FeTi with uhv residual gas studied by XPS

M. Polak, M. Hefetz, M. H. Mintz, M. P. Dariel

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

X-ray photoelectron spectroscopy (XPS) studies of polycrystalline FeTi surfaces under UHV conditions (2 × 10-10 Torr) revealed the presence of selective interactions between the titanium atoms at the ion-sputtered surface and H2O molecules from the residual gas. Titanium oxide (TiO) becomes during the exposure the dominant surface species as inferred from the Ti(2p 3 2) and O(1s) chemical shifts. The Fe(2p) spectrum characteristic of metallic iron hardly changed during the entire exposure. Sputter-induced structural defects at the FeTi surfaces are supposed to accelerate TiO nucleation.

Original languageEnglish
Pages (from-to)739-744
Number of pages6
JournalSurface Science
Volume126
Issue number1-3
DOIs
StatePublished - 2 Mar 1983

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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