The Role of Amplitude and Phase in Fluorescence Coherence Imaging: From Wide Field to Nanometer Depth Profiling

A. Bilenca; C. Joo; A. Ozcan; J. F. De Boer; B. Bouma; G. Tearney

doi:10.1109/CLEO.2007.4453093

The Role of Amplitude and Phase in Fluorescence Coherence Imaging: From Wide Field to Nanometer Depth Profiling

A. Bilenca, C. Joo, A. Ozcan, J. F. De Boer, B. Bouma, G. Tearney

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.

Original language	English
Title of host publication	Conference on Lasers and Electro-Optics, CLEO 2007
DOIs	https://doi.org/10.1109/CLEO.2007.4453093
State	Published - 6 May 2007
Externally published	Yes
Event	Conference on Lasers and Electro-Optics, CLEO 2007 - Baltimore, MD, United States Duration: 6 May 2007 → 6 May 2007

Publication series

Name	Optics InfoBase Conference Papers
ISSN (Electronic)	2162-2701

Conference

Conference	Conference on Lasers and Electro-Optics, CLEO 2007
Country/Territory	United States
City	Baltimore, MD
Period	6/05/07 → 6/05/07

ASJC Scopus subject areas

Instrumentation
Atomic and Molecular Physics, and Optics

Access to Document

10.1109/CLEO.2007.4453093

Cite this

@inproceedings{12ad347bb3744f98adb74ec1768887be,

title = "The Role of Amplitude and Phase in Fluorescence Coherence Imaging: From Wide Field to Nanometer Depth Profiling",

abstract = "We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.",

author = "A. Bilenca and C. Joo and A. Ozcan and {De Boer}, {J. F.} and B. Bouma and G. Tearney",

year = "2007",

month = may,

day = "6",

doi = "10.1109/CLEO.2007.4453093",

language = "English",

isbn = "1557528349",

series = "Optics InfoBase Conference Papers",

booktitle = "Conference on Lasers and Electro-Optics, CLEO 2007",

note = "Conference on Lasers and Electro-Optics, CLEO 2007 ; Conference date: 06-05-2007 Through 06-05-2007",

}

Bilenca, A, Joo, C, Ozcan, A, De Boer, JF, Bouma, B & Tearney, G 2007, The Role of Amplitude and Phase in Fluorescence Coherence Imaging: From Wide Field to Nanometer Depth Profiling. in Conference on Lasers and Electro-Optics, CLEO 2007., 4453093, Optics InfoBase Conference Papers, Conference on Lasers and Electro-Optics, CLEO 2007, Baltimore, MD, United States, 6/05/07. https://doi.org/10.1109/CLEO.2007.4453093

TY - GEN

T1 - The Role of Amplitude and Phase in Fluorescence Coherence Imaging

T2 - Conference on Lasers and Electro-Optics, CLEO 2007

AU - Bilenca, A.

AU - Joo, C.

AU - Ozcan, A.

AU - De Boer, J. F.

AU - Bouma, B.

AU - Tearney, G.

PY - 2007/5/6

Y1 - 2007/5/6

N2 - We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.

AB - We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.

UR - http://www.scopus.com/inward/record.url?scp=84899001268&partnerID=8YFLogxK

U2 - 10.1109/CLEO.2007.4453093

DO - 10.1109/CLEO.2007.4453093

M3 - Conference contribution

AN - SCOPUS:82955178606

SN - 1557528349

SN - 9781557528346

T3 - Optics InfoBase Conference Papers

BT - Conference on Lasers and Electro-Optics, CLEO 2007

Y2 - 6 May 2007 through 6 May 2007

ER -

The Role of Amplitude and Phase in Fluorescence Coherence Imaging: From Wide Field to Nanometer Depth Profiling

Abstract

Publication series

Conference

ASJC Scopus subject areas

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