The roughness and growth of a silver-mercury reaction interface

Avraham Be'er, Yossi Lereah, Inbal Hecht, Haim Taitelbaum

Research output: Contribution to journalConference articlepeer-review

16 Scopus citations


The spreading of small droplets (50-200 μm) of Hg on thin Ag films has been studied, using optical microscope, scanning electron microscope (SEM) and atomic force microscope (AFM). The growing rough surfaces have been analyzed in order to determine the roughness (α) and growth (β) exponents. For Ag thickness of 500-2000 Å we have found that α = 0.66±0.03 and β = 0.46±0.02, while for Ag thickness of 0.1 mm, α = 0.77±0.04 and β = 0.60±0.02. Both sets of exponents satisfy the scaling relation α + α/β = 2. In both systems the roughness exponent α crosses over to 0.5 in the final stages of the experiment and for relatively long length scales (order of a few μm).

Original languageEnglish
Pages (from-to)297-301
Number of pages5
JournalPhysica A: Statistical Mechanics and its Applications
Issue number1-4
StatePublished - 15 Dec 2001
Externally publishedYes
EventInternational Workshop on Frontiers in the Physics of Complex Systems - Ramat-Gan, Israel
Duration: 25 Mar 200128 Mar 2001


  • Diffusion
  • Interface
  • Reaction
  • Surface growth
  • Wetting

ASJC Scopus subject areas

  • Statistics and Probability
  • Condensed Matter Physics


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