The spatial distribution of light from silicon LEDs

Herzl Aharoni, Monuko Du Plessis

Research output: Contribution to journalArticlepeer-review

14 Scopus citations


Well-defined light patterns emitted from circular guard-ring avalanche silicon photodiodes made on CZ substrates provide an experimental proof that the reverse current does not flow all over the junction area. This fact should be taken into account in calculations of current densities in future device design considerations. The light patterns originate from zones of crystal striations. These striations, which are usually considered to be a negative factor, are utilized here to control the overall light-emission intensity. It is shown that the light-pattern dimensions and intensity are current controlled. The percentage of light area coverage, the overall emitted light intensity and the average reverse-current density are interrelated and determined as a function of the operating current. Four distinct regions of operation are identified. It is shown that the emitted light intensity is directly proportional to the area of light emission in three of the regions (low, medium and high currents) even at high junction temperatures. The results are application oriented with regard to the design of future silicon light-emitting diodes (LEDs).

Original languageEnglish
Pages (from-to)233-237
Number of pages5
JournalSensors and Actuators, A: Physical
Issue number3
StatePublished - 1 Jan 1996


  • Light patterns
  • Light-emitting diodes
  • Silicon

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Electrical and Electronic Engineering


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