Thermal resistance evaluation in 3-D thermal simulation of MOSFET transistors

I. Hirsch, E. Berman, N. Haik

Research output: Contribution to journalArticlepeer-review

5 Scopus citations
Original languageEnglish
Pages (from-to)106-108
Number of pages3
JournalSolid State Electronics
Volume36
Issue number1
DOIs
StatePublished - 1 Jan 1993

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