Thickness and refractive index measurements using multiple beam interference fringes (FECO)

Rafael Tadmor; Nianhuan Chen; Jacob N. Israelachvili

doi:10.1016/S0021-9797(03)00405-3

Thickness and refractive index measurements using multiple beam interference fringes (FECO)

Rafael Tadmor, Nianhuan Chen, Jacob N. Israelachvili

Research output: Contribution to journal › Article › peer-review

29 Scopus citations

Abstract

We report on the use of optical interferometry employing fringes of equal chromatic order (FECO) in a surface force apparatus (SFA) to determine film thicknesses and refractive indices of confined media for a wide range of separations. In particular, we show how to calculate the surface separation (film thickness) based on two fringes whose contact position was not measured. We discuss the measurement accuracy, and though the theoretical accuracy is 1 Å for all separations, we show that in practice, for large separations, it is very hard to get to this accuracy.

Original language	English
Pages (from-to)	548-553
Number of pages	6
Journal	Journal of Colloid and Interface Science
Volume	264
Issue number	2
DOIs	https://doi.org/10.1016/S0021-9797(03)00405-3
State	Published - 15 Aug 2003
Externally published	Yes

Keywords

Dispersion
Dispersive phase change
Large separations
Thick films
Three-layer interferometer

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Biomaterials
Surfaces, Coatings and Films
Colloid and Surface Chemistry

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10.1016/S0021-9797(03)00405-3

Cite this

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title = "Thickness and refractive index measurements using multiple beam interference fringes (FECO)",

abstract = "We report on the use of optical interferometry employing fringes of equal chromatic order (FECO) in a surface force apparatus (SFA) to determine film thicknesses and refractive indices of confined media for a wide range of separations. In particular, we show how to calculate the surface separation (film thickness) based on two fringes whose contact position was not measured. We discuss the measurement accuracy, and though the theoretical accuracy is 1 {\AA} for all separations, we show that in practice, for large separations, it is very hard to get to this accuracy.",

keywords = "Dispersion, Dispersive phase change, Large separations, Thick films, Three-layer interferometer",

author = "Rafael Tadmor and Nianhuan Chen and Israelachvili, {Jacob N.}",

note = "Funding Information: We thank Qi Lin, Peter Ercius, and Linh Tran for useful discussions and computational assistance. NASA Grant NAG3-2115 is gratefully acknowledged.",

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T1 - Thickness and refractive index measurements using multiple beam interference fringes (FECO)

AU - Tadmor, Rafael

AU - Chen, Nianhuan

AU - Israelachvili, Jacob N.

N1 - Funding Information: We thank Qi Lin, Peter Ercius, and Linh Tran for useful discussions and computational assistance. NASA Grant NAG3-2115 is gratefully acknowledged.

PY - 2003/8/15

Y1 - 2003/8/15

N2 - We report on the use of optical interferometry employing fringes of equal chromatic order (FECO) in a surface force apparatus (SFA) to determine film thicknesses and refractive indices of confined media for a wide range of separations. In particular, we show how to calculate the surface separation (film thickness) based on two fringes whose contact position was not measured. We discuss the measurement accuracy, and though the theoretical accuracy is 1 Å for all separations, we show that in practice, for large separations, it is very hard to get to this accuracy.

AB - We report on the use of optical interferometry employing fringes of equal chromatic order (FECO) in a surface force apparatus (SFA) to determine film thicknesses and refractive indices of confined media for a wide range of separations. In particular, we show how to calculate the surface separation (film thickness) based on two fringes whose contact position was not measured. We discuss the measurement accuracy, and though the theoretical accuracy is 1 Å for all separations, we show that in practice, for large separations, it is very hard to get to this accuracy.

KW - Dispersion

KW - Dispersive phase change

KW - Large separations

KW - Thick films

KW - Three-layer interferometer

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DO - 10.1016/S0021-9797(03)00405-3

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SN - 0021-9797

VL - 264

SP - 548

EP - 553

JO - Journal of Colloid and Interface Science

JF - Journal of Colloid and Interface Science

IS - 2

ER -

Thickness and refractive index measurements using multiple beam interference fringes (FECO)

Abstract

Keywords

ASJC Scopus subject areas

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