Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) imaging of deuterium assisted cracking in a 2205 duplex stainless steel micro-structure

Oded Sobol, Gerald Holzlechner, Gert Nolze, Thomas Wirth, Dan Eliezer, Thomas Boellinghaus, Wolfgang E.S. Unger

Research output: Contribution to journal › Article › peer-review

29 Scopus citations

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Engineering

Chemistry

Material Science