Tip-sample interaction in a "shear-force" near-field scanning optical microscope

Kate Hsu, Levi A. Gheber

Research output: Contribution to journalArticlepeer-review

22 Scopus citations


The interaction between the tip of a near-field scanning optical microscope (NSOM) and the sample it scans is analyzed and compared to a simple tapping model. The approach curves acquired with the NSOM are in excellent agreement with the model, and additional experiments strongly point against a noncontact interaction (such as shear force). Based on this model we are also able to explain the oscillations pattern of the feedback loop. We conclude that our straight-fiber tip, operating under "shear-force" control, intermittently contacts the surface it is scanning, in a way similar to the tapping mode in atomic force microscope.

Original languageEnglish
Pages (from-to)3609-3613
Number of pages5
JournalReview of Scientific Instruments
Issue number9
StatePublished - 1 Jan 1999
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation


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