Two-dimensional CMOS image sensor characterization

Igor Shcherback; Razy Segal; Alexander Belenky; Orly Yadid-Pecht

Two-dimensional CMOS image sensor characterization

Igor Shcherback, Razy Segal, Alexander Belenky, Orly Yadid-Pecht

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

In this work two-dimensional (2-D) measurements obtained by the unique submicron scanning system (S-cube system) for the industrial graded CMOS image sensor (CIS) are presented. Full 2-D point spread function (PSF) extracted for several CIS subarrays via sub-micron spot light stimulation is used for full sensor characterization; including crosstalk (CTK) generation phenomena, its dependence on the array topology and the "neighborhood" condition, along with a 2-D pixel MTF calculated from the PSF measurements. The degradation of the imager performance caused by the diffusion effects is apparent from the calculated MTF. The effectiveness and advantages of the proposed method are shown; enabling both to determine the influence of each pixel-composing element on its overall signal, along with sensor resolution abilities characterization for each wavelength of interest. The advantages and necessities of 2Dcharacterization for sensor performance understanding and improvement are clearly emphasized.

Original language	English
Title of host publication	ISCAS 2006
Subtitle of host publication	2006 IEEE International Symposium on Circuits and Systems, Proceedings
Pages	3582-3585
Number of pages	4
State	Published - 1 Dec 2006
Event	ISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems - Kos, Greece Duration: 21 May 2006 → 24 May 2006

Publication series

Name	Proceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)	0271-4310

Conference

Conference	ISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems
Country/Territory	Greece
City	Kos
Period	21/05/06 → 24/05/06

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

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title = "Two-dimensional CMOS image sensor characterization",

abstract = "In this work two-dimensional (2-D) measurements obtained by the unique submicron scanning system (S-cube system) for the industrial graded CMOS image sensor (CIS) are presented. Full 2-D point spread function (PSF) extracted for several CIS subarrays via sub-micron spot light stimulation is used for full sensor characterization; including crosstalk (CTK) generation phenomena, its dependence on the array topology and the {"}neighborhood{"} condition, along with a 2-D pixel MTF calculated from the PSF measurements. The degradation of the imager performance caused by the diffusion effects is apparent from the calculated MTF. The effectiveness and advantages of the proposed method are shown; enabling both to determine the influence of each pixel-composing element on its overall signal, along with sensor resolution abilities characterization for each wavelength of interest. The advantages and necessities of 2Dcharacterization for sensor performance understanding and improvement are clearly emphasized.",

author = "Igor Shcherback and Razy Segal and Alexander Belenky and Orly Yadid-Pecht",

year = "2006",

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language = "English",

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series = "Proceedings - IEEE International Symposium on Circuits and Systems",

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Shcherback, I, Segal, R, Belenky, A & Yadid-Pecht, O 2006, Two-dimensional CMOS image sensor characterization. in ISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems, Proceedings., 1693401, Proceedings - IEEE International Symposium on Circuits and Systems, pp. 3582-3585, ISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems, Kos, Greece, 21/05/06.

Two-dimensional CMOS image sensor characterization. / Shcherback, Igor; Segal, Razy; Belenky, Alexander et al.
ISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems, Proceedings. 2006. p. 3582-3585 1693401 (Proceedings - IEEE International Symposium on Circuits and Systems).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Two-dimensional CMOS image sensor characterization

AU - Shcherback, Igor

AU - Segal, Razy

AU - Belenky, Alexander

AU - Yadid-Pecht, Orly

PY - 2006/12/1

Y1 - 2006/12/1

N2 - In this work two-dimensional (2-D) measurements obtained by the unique submicron scanning system (S-cube system) for the industrial graded CMOS image sensor (CIS) are presented. Full 2-D point spread function (PSF) extracted for several CIS subarrays via sub-micron spot light stimulation is used for full sensor characterization; including crosstalk (CTK) generation phenomena, its dependence on the array topology and the "neighborhood" condition, along with a 2-D pixel MTF calculated from the PSF measurements. The degradation of the imager performance caused by the diffusion effects is apparent from the calculated MTF. The effectiveness and advantages of the proposed method are shown; enabling both to determine the influence of each pixel-composing element on its overall signal, along with sensor resolution abilities characterization for each wavelength of interest. The advantages and necessities of 2Dcharacterization for sensor performance understanding and improvement are clearly emphasized.

AB - In this work two-dimensional (2-D) measurements obtained by the unique submicron scanning system (S-cube system) for the industrial graded CMOS image sensor (CIS) are presented. Full 2-D point spread function (PSF) extracted for several CIS subarrays via sub-micron spot light stimulation is used for full sensor characterization; including crosstalk (CTK) generation phenomena, its dependence on the array topology and the "neighborhood" condition, along with a 2-D pixel MTF calculated from the PSF measurements. The degradation of the imager performance caused by the diffusion effects is apparent from the calculated MTF. The effectiveness and advantages of the proposed method are shown; enabling both to determine the influence of each pixel-composing element on its overall signal, along with sensor resolution abilities characterization for each wavelength of interest. The advantages and necessities of 2Dcharacterization for sensor performance understanding and improvement are clearly emphasized.

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M3 - Conference contribution

AN - SCOPUS:34547254690

SN - 0780393902

SN - 9780780393905

T3 - Proceedings - IEEE International Symposium on Circuits and Systems

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EP - 3585

BT - ISCAS 2006

T2 - ISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems

Y2 - 21 May 2006 through 24 May 2006

ER -

Two-dimensional CMOS image sensor characterization

Abstract

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Conference

ASJC Scopus subject areas

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