Two-dimensional CMOS image sensor characterization

Igor Shcherback, Razy Segal, Alexander Belenky, Orly Yadid-Pecht

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

In this work two-dimensional (2-D) measurements obtained by the unique submicron scanning system (S-cube system) for the industrial graded CMOS image sensor (CIS) are presented. Full 2-D point spread function (PSF) extracted for several CIS subarrays via sub-micron spot light stimulation is used for full sensor characterization; including crosstalk (CTK) generation phenomena, its dependence on the array topology and the "neighborhood" condition, along with a 2-D pixel MTF calculated from the PSF measurements. The degradation of the imager performance caused by the diffusion effects is apparent from the calculated MTF. The effectiveness and advantages of the proposed method are shown; enabling both to determine the influence of each pixel-composing element on its overall signal, along with sensor resolution abilities characterization for each wavelength of interest. The advantages and necessities of 2Dcharacterization for sensor performance understanding and improvement are clearly emphasized.

Original languageEnglish
Title of host publicationISCAS 2006
Subtitle of host publication2006 IEEE International Symposium on Circuits and Systems, Proceedings
Pages3582-3585
Number of pages4
StatePublished - 1 Dec 2006
EventISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems - Kos, Greece
Duration: 21 May 200624 May 2006

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Conference

ConferenceISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems
Country/TerritoryGreece
CityKos
Period21/05/0624/05/06

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