Two-dimensional MTF and crosstalk characterization for CMOS image sensors

Razy Segal, Igor Shcherback, Orly Yadid-Pecht

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This work describes a new approach to CMOS Image Sensors (CIS) characterization, based on the Submicron Scanning System (S-cube system). The S-cube system inherently enables two-dimensional responsivity map acquisition for CISs and provides a 2-D pixel Point Spread Function (PSF), 2-D pixel Modulation Transfer Function (MTF) and 2-D sensor crosstalk (CTK) measurements. The effectiveness and advantages of the proposed method are shown; enabling to determine both, the influence of each pixel-composing element on its overall signal, and sensor resolution abilities characterization for each wavelength of interest. The advantages and necessity of 2-D characterization for sensor performance understanding and improvement are clearly emphasized.

Original languageEnglish
Title of host publication2006 IEEE 24th Convention of Electrical and Electronics Engineers in Israel, IEEEI
Pages349-353
Number of pages5
DOIs
StatePublished - 1 Dec 2006
Event2006 IEEE 24th Convention of Electrical and Electronics Engineers in Israel, IEEEI - Eilat, Israel
Duration: 15 Nov 200617 Nov 2006

Publication series

NameIEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings

Conference

Conference2006 IEEE 24th Convention of Electrical and Electronics Engineers in Israel, IEEEI
Country/TerritoryIsrael
CityEilat
Period15/11/0617/11/06

Keywords

  • Active pixel sensor (APS)
  • CMOS Image Sensor (CIS)
  • Crosstalk (CTK)
  • Modulation Transfer Function (MTF)
  • Point Spread Function (PSF)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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