Two-dimensional surface band structure of operating light emitting devices

R. Shikler; T. Meoded; N. Fried; B. Mishori; Y. Rosenwaks

doi:10.1063/1.370706

Two-dimensional surface band structure of operating light emitting devices

R. Shikler, T. Meoded, N. Fried, B. Mishori, Y. Rosenwaks

Research output: Contribution to journal › Article › peer-review

51 Scopus citations

Abstract

The use of Kelvin force microscopy to 2D potential measurements of operating light emitting devices was demonstrated. The operating device surface band structure was imaged with nanometer resolution. Under forward applied bias, it was shown that the surface band structure is governed by absorption of the internal light emitting diode (LED) emission.

Original language	English
Pages (from-to)	107-113
Number of pages	7
Journal	Journal of Applied Physics
Volume	86
Issue number	1
DOIs	https://doi.org/10.1063/1.370706
State	Published - 1 Jan 1999
Externally published	Yes

ASJC Scopus subject areas

General Physics and Astronomy

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10.1063/1.370706

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title = "Two-dimensional surface band structure of operating light emitting devices",

abstract = "The use of Kelvin force microscopy to 2D potential measurements of operating light emitting devices was demonstrated. The operating device surface band structure was imaged with nanometer resolution. Under forward applied bias, it was shown that the surface band structure is governed by absorption of the internal light emitting diode (LED) emission.",

author = "R. Shikler and T. Meoded and N. Fried and B. Mishori and Y. Rosenwaks",

year = "1999",

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AU - Meoded, T.

AU - Fried, N.

AU - Mishori, B.

AU - Rosenwaks, Y.

PY - 1999/1/1

Y1 - 1999/1/1

N2 - The use of Kelvin force microscopy to 2D potential measurements of operating light emitting devices was demonstrated. The operating device surface band structure was imaged with nanometer resolution. Under forward applied bias, it was shown that the surface band structure is governed by absorption of the internal light emitting diode (LED) emission.

AB - The use of Kelvin force microscopy to 2D potential measurements of operating light emitting devices was demonstrated. The operating device surface band structure was imaged with nanometer resolution. Under forward applied bias, it was shown that the surface band structure is governed by absorption of the internal light emitting diode (LED) emission.

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U2 - 10.1063/1.370706

DO - 10.1063/1.370706

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JO - Journal of Applied Physics

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Two-dimensional surface band structure of operating light emitting devices

Abstract

ASJC Scopus subject areas

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