Uniaxial alignment of cadmium sulfide on polymerized films: electron microscopy and diffraction study

Amir Berman; Deborah Charych

doi:10.1002/(SICI)1521-4095(199903)11:4<296::AID-ADMA296>3.0.CO;2-F

Uniaxial alignment of cadmium sulfide on polymerized films: electron microscopy and diffraction study

Amir Berman
, Deborah Charych

Department of Biotechnology Engineering

Research output: Contribution to journal › Article › peer-review

33 Scopus citations

Abstract

Co-aligned CdS semiconductor particles were nucleated onto the poly(diacetylene) (PDA) thin-film. The resulting particles are crystalline and oriented over micrometer-sized regions of the film. The assemblies were characterized by electron microscopy (EM) and electron diffraction (ED). The relationship between the particles and the underlying polymer substrate was clarified.

Original language	English
Pages (from-to)	296-300
Number of pages	5
Journal	Advanced Materials
Volume	11
Issue number	4
DOIs	https://doi.org/10.1002/(SICI)1521-4095(199903)11:4<296::AID-ADMA296>3.0.CO;2-F
State	Published - 4 Mar 1999

ASJC Scopus subject areas

General Materials Science
Mechanics of Materials
Mechanical Engineering

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10.1002/(SICI)1521-4095(199903)11:4<296::AID-ADMA296>3.0.CO;2-F

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@article{fbb10275e9134f79a2d794fa4e0fbba5,

title = "Uniaxial alignment of cadmium sulfide on polymerized films: electron microscopy and diffraction study",

abstract = "Co-aligned CdS semiconductor particles were nucleated onto the poly(diacetylene) (PDA) thin-film. The resulting particles are crystalline and oriented over micrometer-sized regions of the film. The assemblies were characterized by electron microscopy (EM) and electron diffraction (ED). The relationship between the particles and the underlying polymer substrate was clarified.",

author = "Amir Berman and Deborah Charych",

year = "1999",

month = mar,

day = "4",

doi = "10.1002/(SICI)1521-4095(199903)11:4<296::AID-ADMA296>3.0.CO;2-F",

language = "English",

volume = "11",

pages = "296--300",

journal = "Advanced Materials",

issn = "0935-9648",

publisher = "Wiley-Blackwell",

number = "4",

}

TY - JOUR

T1 - Uniaxial alignment of cadmium sulfide on polymerized films

T2 - electron microscopy and diffraction study

AU - Berman, Amir

AU - Charych, Deborah

PY - 1999/3/4

Y1 - 1999/3/4

N2 - Co-aligned CdS semiconductor particles were nucleated onto the poly(diacetylene) (PDA) thin-film. The resulting particles are crystalline and oriented over micrometer-sized regions of the film. The assemblies were characterized by electron microscopy (EM) and electron diffraction (ED). The relationship between the particles and the underlying polymer substrate was clarified.

AB - Co-aligned CdS semiconductor particles were nucleated onto the poly(diacetylene) (PDA) thin-film. The resulting particles are crystalline and oriented over micrometer-sized regions of the film. The assemblies were characterized by electron microscopy (EM) and electron diffraction (ED). The relationship between the particles and the underlying polymer substrate was clarified.

UR - https://www.scopus.com/pages/publications/0033522091

U2 - 10.1002/(SICI)1521-4095(199903)11:4<296::AID-ADMA296>3.0.CO;2-F

DO - 10.1002/(SICI)1521-4095(199903)11:4<296::AID-ADMA296>3.0.CO;2-F

M3 - Article

AN - SCOPUS:0033522091

SN - 0935-9648

VL - 11

SP - 296

EP - 300

JO - Advanced Materials

JF - Advanced Materials

IS - 4

ER -

Uniaxial alignment of cadmium sulfide on polymerized films: electron microscopy and diffraction study

Abstract

ASJC Scopus subject areas

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