USE OF PHOTOINJECTION TO DETERMINE MINORITY CARRIER-LIFETIME AND DOPING LEVEL PROFILES OF LOW-DOPED MOS STRUCTURES.

U. Efron, J/ Grinberg

Research output: Contribution to conferencePaperpeer-review

Original languageEnglish
Pages792-810
Number of pages19
StatePublished - 1 Dec 1981

ASJC Scopus subject areas

  • Engineering (all)

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