USE OF PHOTOINJECTION TO DETERMINE MINORITY CARRIER-LIFETIME AND DOPING LEVEL PROFILES OF LOW-DOPED MOS STRUCTURES.

U. Efron, J/ Grinberg

    Research output: Contribution to conferencePaperpeer-review

    Original languageEnglish
    Pages792-810
    Number of pages19
    StatePublished - 1 Dec 1981

    ASJC Scopus subject areas

    • General Engineering

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