Voltage fluctuations in Bi2Sr2CaCu2o8+x films at zero field

C. Coccorese, G. Jung, B. Savo

Research output: Contribution to journalArticlepeer-review


Zero-field voltage noise measurements performed on a Bi2Sr2CaCu2O8+x thin film at 77K and at low transport currents provide insight into the nature of fluctuation mechanisms and into their connection with the sample microstructure.

Original languageEnglish
Pages (from-to)1365-1366
Number of pages2
JournalCzechoslovak Journal of Physics
Issue numberSUPPL. 3
StatePublished - 1 Dec 1996

ASJC Scopus subject areas

  • General Physics and Astronomy


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