Abstract
Zero-field voltage noise measurements performed on a Bi2Sr2CaCu2O8+x thin film at 77K and at low transport currents provide insight into the nature of fluctuation mechanisms and into their connection with the sample microstructure.
Original language | English |
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Pages (from-to) | 1365-1366 |
Number of pages | 2 |
Journal | Czechoslovak Journal of Physics |
Volume | 46 |
Issue number | SUPPL. 3 |
DOIs | |
State | Published - 1 Dec 1996 |
ASJC Scopus subject areas
- General Physics and Astronomy