Voltage fluctuations in Bi2Sr2CaCu2o8+x films at zero field

C. Coccorese; G. Jung; B. Savo

doi:10.1007/BF02562797

Voltage fluctuations in Bi₂Sr₂CaCu₂o_8+x films at zero field

C. Coccorese
, G. Jung
, B. Savo

Department of Physics

Research output: Contribution to journal › Article › peer-review

Abstract

Zero-field voltage noise measurements performed on a Bi₂Sr₂CaCu₂O_8+x thin film at 77K and at low transport currents provide insight into the nature of fluctuation mechanisms and into their connection with the sample microstructure.

Original language	English
Pages (from-to)	1365-1366
Number of pages	2
Journal	Czechoslovak Journal of Physics
Volume	46
Issue number	SUPPL. 3
DOIs	https://doi.org/10.1007/BF02562797
State	Published - 1 Dec 1996

ASJC Scopus subject areas

General Physics and Astronomy

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@article{05de67964f0c48009ceb1f5a42997f27,

title = "Voltage fluctuations in Bi2Sr2CaCu2o8+x films at zero field",

abstract = "Zero-field voltage noise measurements performed on a Bi2Sr2CaCu2O8+x thin film at 77K and at low transport currents provide insight into the nature of fluctuation mechanisms and into their connection with the sample microstructure.",

author = "C. Coccorese and G. Jung and B. Savo",

year = "1996",

month = dec,

day = "1",

doi = "10.1007/BF02562797",

language = "English",

volume = "46",

pages = "1365--1366",

journal = "Czechoslovak Journal of Physics",

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TY - JOUR

T1 - Voltage fluctuations in Bi2Sr2CaCu2o8+x films at zero field

AU - Coccorese, C.

AU - Jung, G.

AU - Savo, B.

PY - 1996/12/1

Y1 - 1996/12/1

N2 - Zero-field voltage noise measurements performed on a Bi2Sr2CaCu2O8+x thin film at 77K and at low transport currents provide insight into the nature of fluctuation mechanisms and into their connection with the sample microstructure.

AB - Zero-field voltage noise measurements performed on a Bi2Sr2CaCu2O8+x thin film at 77K and at low transport currents provide insight into the nature of fluctuation mechanisms and into their connection with the sample microstructure.

UR - https://www.scopus.com/pages/publications/77956559932

U2 - 10.1007/BF02562797

DO - 10.1007/BF02562797

M3 - Article

AN - SCOPUS:77956559932

SN - 0011-4626

VL - 46

SP - 1365

EP - 1366

JO - Czechoslovak Journal of Physics

JF - Czechoslovak Journal of Physics

IS - SUPPL. 3

ER -

Voltage fluctuations in Bi₂Sr₂CaCu₂o_8+x films at zero field

Abstract

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