@inproceedings{6dc122751ada4fb99a2bad5a19bec154,
title = "Vulnerability of secured IoT memory against localized back side laser fault injection",
abstract = "Devices aimed for the Internet of Things (loT) market are required to be both low cost and highly secured, as they are expected to be integrated in ordinary 'things' while storing and processing sensitive information. In this paper we examine the vulnerabilities of a commercial secured IoT memory chip to precise and localized back-side laser fault injection. We explain the different steps needed in order to prepare the sample, and describe the laser fault injection setup. From the experiments we conclude that the chip relies mostly on physical countermeasures which renders obsolete in this kind of attack. Further more, the experiments stress the necessity for sophisticated Error Detecting Codes in order to efficiently protect the integrity of the sensitive information stored and processed in the chip.",
author = "Zabib, {David Zooker} and Maoz Vizentovski and Alexander Fish and Osnat Keren and Yoav Weizman",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 7th International Conference on Emerging Security Technologies, EST 2017 ; Conference date: 06-09-2017 Through 08-09-2017",
year = "2017",
month = oct,
day = "30",
doi = "10.1109/EST.2017.8090391",
language = "English",
series = "Proceedings - 2017 7th International Conference on Emerging Security Technologies, EST 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "7--11",
booktitle = "Proceedings - 2017 7th International Conference on Emerging Security Technologies, EST 2017",
address = "United States",
}