The photoelectrochemical behavior of a planar 1 μm thick Ti-doped hematite film deposited on F:SnO2 coated glass was studied with both front and back illumination. Despite low quantum efficiency, photocurrent was observed upon back illumination with low wavelengths, indicating that some photogenerated holes are able to traverse at least 700 nm across the hematite film and effectively oxidize water. This cannot be accounted for using the commonly accepted hole collection length of hematite based on fitting to the Gartner model. Furthermore, under back illumination, 450 nm excitation resulted in increased photocurrent as compared to 530 nm excitation despite most of the light being absorbed further away from the surface. These results demonstrate that the photocurrent is strongly dependent on the optical excitation wavelength and related to both delocalized holes with long lifetime and localized excitations rather than only being dependent on the proximity of the absorption to the surface.