X-ray photoelectron spectroscopic studies of CdSe0.65 Te0.35

M. Polak

doi:10.1016/0368-2048(82)85040-8

X-ray photoelectron spectroscopic studies of CdSe_0.65 Te_0.35

M. Polak

Department of Chemistry

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38 Scopus citations

Abstract

The XPS chemical shifts of cadmium in one of its mixed chalcogenides, CdSe_0.65 Te_0.35, have been studied and compared to the shifts in CdSe and CdTe. The Auger parameter for Cd in CdSe_0.65 Te_0.35, reflecting mainly extraatomic relaxation effects, was found to be useful in characterizing this compound: it has a value intermediate between those in CdSe and in CdTe. A correlation is observed between shifts in the Auger parameter and energy bandgaps for several cadmium compounds. The Se and Te photoelectron chemical shifts reflect an anionic character in both cases, the Se atom having a larger partial ionic charge.

Original language	English
Pages (from-to)	171-176
Number of pages	6
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	28
Issue number	2
DOIs	https://doi.org/10.1016/0368-2048(82)85040-8
State	Published - 1 Jan 1982

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Radiation
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Spectroscopy
Physical and Theoretical Chemistry

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10.1016/0368-2048(82)85040-8

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title = "X-ray photoelectron spectroscopic studies of CdSe0.65 Te0.35",

abstract = "The XPS chemical shifts of cadmium in one of its mixed chalcogenides, CdSe0.65 Te0.35, have been studied and compared to the shifts in CdSe and CdTe. The Auger parameter for Cd in CdSe0.65 Te0.35, reflecting mainly extraatomic relaxation effects, was found to be useful in characterizing this compound: it has a value intermediate between those in CdSe and in CdTe. A correlation is observed between shifts in the Auger parameter and energy bandgaps for several cadmium compounds. The Se and Te photoelectron chemical shifts reflect an anionic character in both cases, the Se atom having a larger partial ionic charge.",

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PY - 1982/1/1

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N2 - The XPS chemical shifts of cadmium in one of its mixed chalcogenides, CdSe0.65 Te0.35, have been studied and compared to the shifts in CdSe and CdTe. The Auger parameter for Cd in CdSe0.65 Te0.35, reflecting mainly extraatomic relaxation effects, was found to be useful in characterizing this compound: it has a value intermediate between those in CdSe and in CdTe. A correlation is observed between shifts in the Auger parameter and energy bandgaps for several cadmium compounds. The Se and Te photoelectron chemical shifts reflect an anionic character in both cases, the Se atom having a larger partial ionic charge.

AB - The XPS chemical shifts of cadmium in one of its mixed chalcogenides, CdSe0.65 Te0.35, have been studied and compared to the shifts in CdSe and CdTe. The Auger parameter for Cd in CdSe0.65 Te0.35, reflecting mainly extraatomic relaxation effects, was found to be useful in characterizing this compound: it has a value intermediate between those in CdSe and in CdTe. A correlation is observed between shifts in the Auger parameter and energy bandgaps for several cadmium compounds. The Se and Te photoelectron chemical shifts reflect an anionic character in both cases, the Se atom having a larger partial ionic charge.

UR - https://www.scopus.com/pages/publications/0012799514

U2 - 10.1016/0368-2048(82)85040-8

DO - 10.1016/0368-2048(82)85040-8

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AN - SCOPUS:0012799514

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JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

IS - 2

ER -

X-ray photoelectron spectroscopic studies of CdSe_0.65 Te_0.35

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