XPS and SAM studies of the hydrogen-absorbing ZrCr2 compound

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14 Scopus citations

Abstract

X-ray photoelectron spectroscopy (XPS) and scanning Auger microprobe (SAM) were utilized to investigate the surface layer of ZrCr2 down to several hundreds angstroms. The surface depth profile shows initially a Zr-rich, Cr-defficient region. This deviation from the bulk stoichiometry is assumed to be due to a Zr segregation towards the surface boundary in the presence of atmospheric air and a formation of the appropriate oxide. Cr exists mainly in a metallic form even close to the external surface. These surface properties resemble those of other previously investigated hydrogen absorbing compounds. SAM measurements revealed local surface regions 10-20 microns wide which are rich either in ZrO2 or metallic chromium. This surface decomposition may also contribute to the good hydrogen sorption kinetics. In addition, small and opposite shifts in binding energies of Zr and Cr in their intermetallic ZrCr2 form were observed with respect to their pure metal state. This observation may be qualitatively explained in terms of charge transfer from the less to the more electronegative metal.

Original languageEnglish
Pages (from-to)1311-1318
Number of pages8
JournalMaterials Research Bulletin
Volume16
Issue number10
DOIs
StatePublished - 1 Jan 1981

ASJC Scopus subject areas

  • Materials Science (all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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